相關(guān)內(nèi)容鏈接：

1. SCI論文中怎樣描述XRD結(jié)果？ Part 1. XRD譜圖作為定性分析手段

2. SCI論文中怎樣描述SEM結(jié)果？ Part 1. 詳細(xì)描述樣品有著怎樣的形貌

3. SCI論文中怎樣描述TEM結(jié)果？ Part 1. 詳細(xì)描述樣品有著怎樣的形貌，由哪些微觀結(jié)構(gòu)組成。

4. 寫(xiě)作從點(diǎn)滴開(kāi)始——SCI論文中如何描述物理吸脫附實(shí)驗(yàn)結(jié)果？

5. SCI論文中如何描述XPS實(shí)驗(yàn)結(jié)果？

6. SCI論文中如何描述FT-IR實(shí)驗(yàn)結(jié)果？

1. 如何非常詳細(xì)地描述SAXS的實(shí)驗(yàn)結(jié)果？

舉例：

The SAXS pattern of the solvent-extracted PMO-SBA-16 shows three well-resolved peaks at very small scattering angles, with interplanar d spacings of 12.8, 9.03, and 7.38 nm. These three peaks can be indexable as (110), (200), and (211) reflections of the body-centered 3D cubic space group (Im3m), similar to that reported for the silica-based mesoporous counterpart SBA-16. The unit cell parameter of the cubic lattice is as large as 18.1 nm. This is the first large-pore PMO material that exhibits such a highly ordered 3D mesostructure. By contrast, the SAXS pattern of the solvent-extracted control sample F127 blank prepared in the absence of K₂SO₄ reveals the formation of amorphous gel.

參考文獻(xiàn) :Chem. Commun., 2003, 2692-2693

提煉語(yǔ)言模板：

定性分析結(jié)果

觀察到的結(jié)果：The SAXS pattern of the 樣品名稱(chēng) shows three well-resolved peaks at very small scattering angles, with interplanar d spacings of 面間距 nm.

對(duì)結(jié)果進(jìn)行分析：These three peaks can be indexable as 晶面指數(shù) reflections of the 晶體結(jié)構(gòu)類(lèi)型, similar to that reported for the 已報(bào)道的結(jié)果. 

定量分析結(jié)果

晶胞參數(shù)：The unit cell parameter of the cubic lattice is as large as __.

對(duì)比討論

By contrast, the SAXS pattern of the 對(duì)比樣品 prepared 制備條件 reveals the formation of amorphous gel.

備注：有關(guān)SAXS的基本原理以及數(shù)據(jù)分析，我們后面會(huì)結(jié)合實(shí)例對(duì)其進(jìn)行分析，敬請(qǐng)期待！

2. 不同文章中描寫(xiě)XPS結(jié)果可能詳略不一，下面總結(jié)一些比較常見(jiàn)的寫(xiě)法供大家參考。

注：藍(lán)色字體部分即為句型模板。

A. LP-FDU-12 materials synthesized at low temperatures were first examined by X-ray diffraction (XRD) and further confirmed by the small-angle X-ray scattering (SAXS) method.The XRD pattern of S-17-100 shows six well-resolved diffraction peaks (SI). A typical SAXS pattern of sample S-17-100 (Figure 1a) also exhibits six peaks, which can be exactly indexed to the 111, 220,311, 331, 333, and 442 reflections of a fcc structure (Fm3m). The cell parameter is calculated to be 34.6 nm (33.0 nm from XRD). 

Ref.: J. Am. Chem. Soc., 2005, 127 (31),pp 10794–10795

B. The small-angle X-ray scattering (SAXS) patterns of as-made FDU-16 clearly show three well-resolved diffraction peaks with q values of 0.47, 0.64, and 0.80 nm^-1(Figure 1a). Four additional diffraction peaks at q values of 0.88, 1.04, 1.12, and 1.22 nm^-1 can also be detected. The q-value ratios of these peaks are exactly1:√2:√3:√4:√5:√6:√7 and canbe indexed as 110, 200,211, 220, 310, 222, and 321 Bragg reflections, respectively, associated with the body-centered cubic Im3?m symmetry.

 Ref.: Chem. Mater., 2006, 18 (18),pp 4447–4464

C. The bulk structure of the mesoporous silica prepared with 1 as template via the nanocasting technique was characterized by small-angle X-ray scattering (SAXS). SAXS has turned out to be a powerful technique with which to investigate the structure of two-phase systems, (i.e.,nanostructure materials that can be supposed to be composed of two domains ofconstant electron density). The SAXS diffractogram of the present sample is shown in Figure 2. It exhibits a significantly main peak at s ≈ 0.20 nm,^-1 which corresponds to the packing of the wormlike pores into a certain distorted 3D alignment. The position of th epeak is related to a length scale of approximately 5 nm, the averaged pore-to-pore distance, in good agreement with the TEM observation.

Ref.: Nano Letters, 2004, 4 (3), pp 477–481

當(dāng)SAXS作為一個(gè)輔助的表征手段來(lái)印證前面的表征結(jié)果時(shí)，也可以寫(xiě)得很簡(jiǎn)單

D. Small-angle X-ray scattering (SAXS; see the Supporting Information) reveals four well-resolved reflections, further confirming a highly ordered hexagonal mesostructure. 

E.  Small-angle X-ray scattering experiments confirmed the presence of two kinds of cubic structures (CD and CP). 

Ref.: Langmuir, 2001, 17, 3917–3922

研之成理面向所有感興趣的朋友征集專(zhuān)欄作家，主要包括專(zhuān)業(yè)軟件（比如Digital Micrograph, TIA, Photoshop，Chemoffice，Material studio等）和基礎(chǔ)知識(shí)（XRD結(jié)構(gòu)精修，熱分析，核磁，程序升溫實(shí)驗(yàn)，同步輻射，質(zhì)譜，AFM，STM）的分享，以及相關(guān)領(lǐng)域最新文獻(xiàn)賞析。目前，由于小編人數(shù)有限，總結(jié)的周期會(huì)比較長(zhǎng)，如果有更加專(zhuān)業(yè)的人來(lái)分擔(dān)一部分的話(huà)，應(yīng)該可以讓大家更快更好地學(xué)到更多內(nèi)容。